Multi-element, multi-purpose analyzer, ideal for measuring ultra-low and trace element concentrations into the percent levels. These analyzers serve many industries and are especially well-suited for semi-quantitative determination of elemental content in complete unknowns.
Features a unique and improved close-coupled Cartesian Geometry optical kernel that dramatically increases signal-to-noise ratio and delivers enhanced elemental analysis.
Unlike conventional EDXRF spectrometers, NEX CG II Series are indirect excitation systems using secondary targets rather than tube filters.

SYSTEM FEATURES
• Indirect Excitation
• High-power 50 kV 50 W Pd anode X-ray tube
• 5 secondary targets and polarizers combined
• Large-area Silicon Drift Detector (SDD)
• <135 eV @ Mn K-alpha line
• Digital pulse processor with user-selectable shaping times
• Large Sample Chamber
• 32.5 cm diameter x 7.5 cm deep
• Powerful and easy-to-use QuantEZ® software
• Multilingual user interface